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Semiconductors

6.1 Intrinsic Semiconductors

At T=0T = 0The valence band is completely filled and the conduction band is completely empty. There is a band gap EgE_g.

At finite TTElectrons are thermally excited across the gap. The intrinsic carrier concentration:

ni=pi=NcNveEg/(2kBT)n_i = p_i = \sqrt{N_c N_v}\, e^{-E_g/(2k_B T)}

Where NcN_c and NvN_v are the effective density of states in the conduction and valence bands:

Nc=2(2πmekBTh2)3/2,Nv=2(2πmhkBTh2)3/2N_c = 2\left(\frac{2\pi m_e^* k_B T}{h^2}\right)^{3/2}, \quad N_v = 2\left(\frac{2\pi m_h^* k_B T}{h^2}\right)^{3/2}

Here mem_e^* and mhm_h^* are the effective masses of electrons and holes.

Fermi level in an intrinsic semiconductor: EF=(Ec+Ev)/2+34kBTln(mh/me)E_F = (E_c + E_v)/2 + \frac{3}{4}k_B T\ln(m_h^*/m_e^*). For me=mhm_e^* = m_h^*: EF=Eg/2E_F = E_g/2.

6.2 Extrinsic Semiconductors

n-type: Doping with donor atoms (e.g., P in Si) that donate electrons to the conduction band. Majority carriers: electrons.

p-type: Doping with acceptor atoms (e.g., B in Si) that accept electrons from the valence band, Creating holes. Majority carriers: holes.

For nn-type with donor concentration NDN_D (non-degenerate, TT not too high):

nND,p=ni2NDn \approx N_D, \quad p = \frac{n_i^2}{N_D}

EFEckBTln(NcND)E_F \approx E_c - k_B T \ln\left(\frac{N_c}{N_D}\right)

For pp-type with acceptor concentration NAN_A:

pNA,n=ni2NAp \approx N_A, \quad n = \frac{n_i^2}{N_A}

EFEv+kBTln(NvNA)E_F \approx E_v + k_B T \ln\left(\frac{N_v}{N_A}\right)

Mass action law: np=ni2np = n_i^2 holds at thermal equilibrium regardless of doping.

6.3 The p-n Junction

At the interface between p-type and n-type material:

  • Depletion region: Mobile carriers diffuse, leaving behind fixed ionised donors (n-side) and acceptors (p-side), creating a built-in electric field.
  • Built-in potential: V0=kBTeln(NANDni2)V_0 = \frac{k_B T}{e}\ln\left(\frac{N_A N_D}{n_i^2}\right).
  • Depletion width: W=2εsV0e(1NA+1ND)W = \sqrt{\frac{2\varepsilon_s V_0}{e}\left(\frac{1}{N_A} + \frac{1}{N_D}\right)} where εs\varepsilon_s is the permittivity of the semiconductor.

Current-voltage characteristic (Shockley equation):

I=I0(eeV/(kBT)1)I = I_0\left(e^{eV/(k_B T)} - 1\right)

Where I0I_0 is the reverse saturation current. Forward bias (V>0V \gt 0) exponentially increases the Current. Reverse bias (V<0V \lt 0) gives approximately II0I \approx -I_0.

Derivation of the built-in potential. In equilibrium, the Fermi level is constant. The potential Difference between the n-side (where EFE_F is near EcE_c) and the p-side (where EFE_F is near EvE_v) Is:

eV0=Ec,nEc,p=Eg(EcEF)n(EFEv)peV_0 = E_{c,n} - E_{c,p} = E_g - (E_c - E_F)_n - (E_F - E_v)_p

Using n=Nce(EcEF)/(kBT)n = N_c e^{-(E_c - E_F)/(k_B T)} and p=Nve(EFEv)/(kBT)p = N_v e^{-(E_F - E_v)/(k_B T)} with np=ni2np = n_i^2:

V0=kBTeln(NANDni2)V_0 = \frac{k_B T}{e}\ln\left(\frac{N_A N_D}{n_i^2}\right)

\blacksquare

Capacitance. The depletion region acts as a parallel-plate capacitor:

C=εsAW=Aeεs2NANDNA+ND1V0VC = \frac{\varepsilon_s A}{W} = A\sqrt{\frac{e\varepsilon_s}{2}\frac{N_A N_D}{N_A + N_D}\frac{1}{V_0 - V}}

This C1/V0VC \propto 1/\sqrt{V_0 - V} dependence is used experimentally to determine NAN_A and NDN_D (C—V profiling).

6.4 Band Diagrams

In equilibrium, the Fermi level is constant across the junction. Under forward bias, the bands on The n-side are raised relative to the p-side, reducing the barrier. Under reverse bias, the barrier Is increased.

6.5 Band Gap Engineering

The electronic and optical properties of semiconductors can be tailored by forming heterostructures --- junctions between different semiconductor materials.

Band offsets. When two semiconductors with different band gaps are joined, the conduction band Minimum and valence band maximum are offset. The type-I (straddling) alignment has the band gap Of one material contained within the gap of the other (e.g., GaAs/AlGaAs). The type-II (staggered) alignment has the conduction and valence band edges of different materials at different Energies (e.g., InAs/GaSb).

Quantum wells. A thin layer of a narrow-gap semiconductor (e.g., 10 nm of GaAs) sandwiched Between wide-gap barriers (e.g., AlGaAs) confines electrons and holes in one dimension. The Confinement energy for an infinite well of width LL:

En=n2π222mL2E_n = \frac{n^2 \pi^2 \hbar^2}{2m^* L^2}

This quantisation raises the effective band gap, allowing the optical transition energy to be tuned By varying LL.

Quantum wires and dots. Further confinement in two dimensions (quantum wire) or three dimensions (quantum dot) leads to additional quantisation. Quantum dots have discrete, atom-like energy levels And are often called “artificial atoms.”

Strain engineering. Lattice mismatch between a thin film and its substrate induces strain, Modifying the band structure. Tensile strain reduces the band gap, while compressive Strain can lift degeneracies (e.g., splitting the heavy-hole and light-hole bands).

6.6 Optical Properties of Semiconductors

Absorption. A photon of energy ω\hbar\omega can be absorbed if ωEg\hbar\omega \geq E_gPromoting An electron from the valence band to the conduction band.

  • Direct band gap (e.g., GaAs, InP): The conduction band minimum and valence band maximum occur at the same k\mathbf{k}. Photon absorption requires only energy conservation (the photon momentum ω/c0\hbar\omega/c \approx 0 is negligible). The absorption coefficient rises sharply above EgE_g:

    α(ω)ωEg\alpha(\omega) \propto \sqrt{\hbar\omega - E_g}

  • Indirect band gap (e.g., Si, Ge): The band edges occur at different k\mathbf{k}. A phonon is required to conserve momentum, making the absorption weaker and temperature-dependent:

    α(ω)(ωEgΩ)2eΩ/kBT1+(ωEg+Ω)21eΩ/kBT\alpha(\omega) \propto \frac{(\hbar\omega - E_g - \hbar\Omega)^2}{e^{\hbar\Omega/k_BT} - 1} + \frac{(\hbar\omega - E_g + \hbar\Omega)^2}{1 - e^{-\hbar\Omega/k_BT}}

where Ω\hbar\Omega is the phonon energy.

Excitons. The electron and hole created by photon absorption are attracted by the Coulomb Interaction, forming a bound state called an exciton with binding energy:

Eex=μe42(4πεs)22=μmeεr2×13.6 eVE_{\mathrm{ex} = \frac{\mu e^4}{2(4\pi\varepsilon_s)^2\hbar^2} = \frac{\mu}{m_e\varepsilon_r^2} \times 13.6\ \mathrm{eV}}

Where μ=memh/(me+mh)\mu = m_e^* m_h^*/(m_e^* + m_h^*) is the reduced mass and εr\varepsilon_r is the relative Permittivity. Excitons produce sharp absorption lines slightly below EgE_g.

Photoluminescence. When electron—hole pairs recombine radiatively, photons are emitted at Energies near EgE_g. Direct-gap materials are efficient light emitters (used in LEDs and laser Diodes). Indirect-gap materials like Si have very low radiative efficiency.

Worked Example: Intrinsic Carrier Concentration in Silicon

For Si at T=300T = 300 K: Eg=1.12E_g = 1.12 eV, me=1.08mem_e^* = 1.08\,m_e, mh=0.56mem_h^* = 0.56\,m_e.

Nc=2(2π×1.08×9.11×1031×1.381×1023×300(6.626×1034)2)3/2=2.81×1025 m3N_c = 2\left(\frac{2\pi \times 1.08 \times 9.11 \times 10^{-31} \times 1.381 \times 10^{-23} \times 300}{(6.626 \times 10^{-34})^2}\right)^{3/2} = 2.81 \times 10^{25}\ \mathrm{m}^{-3}

Nv=2(2π×0.56×9.11×1031×1.381×1023×300(6.626×1034)2)3/2=1.04×1025 m3N_v = 2\left(\frac{2\pi \times 0.56 \times 9.11 \times 10^{-31} \times 1.381 \times 10^{-23} \times 300}{(6.626 \times 10^{-34})^2}\right)^{3/2} = 1.04 \times 10^{25}\ \mathrm{m}^{-3}

ni=NcNveEg/(2kBT)=2.81×1.04×1025×e1.12/(2×0.02585)n_i = \sqrt{N_c N_v}\,e^{-E_g/(2k_B T)} = \sqrt{2.81 \times 1.04} \times 10^{25} \times e^{-1.12/(2 \times 0.02585)}

ni=1.71×1025×e21.66=1.71×1025×3.95×1010=6.75×1015 m3n_i = 1.71 \times 10^{25} \times e^{-21.66} = 1.71 \times 10^{25} \times 3.95 \times 10^{-10} = 6.75 \times 10^{15}\ \mathrm{m}^{-3}

The accepted value is ni1.5×1016 m3n_i \approx 1.5 \times 10^{16}\ \mathrm{m}^{-3} at 300 K.

6.7 Semiconductor Devices

Light-emitting diodes (LEDs). Under forward bias, electrons and holes are injected into the Depletion region where they recombine radiatively. The emission wavelength is determined by the Band gap: λ=hc/Eg\lambda = hc/E_g. GaAs (Eg=1.42E_g = 1.42 eV) emits in the infrared; GaN (Eg=3.4E_g = 3.4 eV) Emits in the ultraviolet; InGaN alloys span the visible spectrum.

Solar cells. A p-n junction under illumination generates electron—hole pairs. The built-in Field separates them, producing a photocurrent. The open-circuit voltage satisfies VOC<Eg/eV_{\mathrm{OC} \lt E_g/e} ( VOC0.7Eg/eV_{\mathrm{OC} \approx 0.7\,E_g/e}). The power conversion Efficiency is limited by the Shockley—Queisser limit (33%\sim 33\% for a single junction) Due to spectral mismatch, thermalisation, and radiative recombination losses.

Field-effect transistor (FET). A voltage applied to a gate electrode modulates the conductivity Of a semiconductor channel. In a MOSFET (metal—oxide—semiconductor FET), the gate voltage creates An inversion layer at the oxide—semiconductor interface, forming a conductive channel. The Threshold voltage VTV_T depends on the oxide thickness, doping, and work function difference.

HEMTs and HBTs. High-electron-mobility transistors (HEMTs) use heterojunctions (e.g., AlGaAs/GaAs) to create a two-dimensional electron gas (2DEG) with very high mobility. Heterojunction Bipolar transistors (HBTs) use a wide-gap emitter to improve injection efficiency.