Skip to content

Diffraction

4.1 Huygens-Fresnel Principle

Every point on a wavefront acts as a source of secondary spherical wavelets. The new wavefront is the Envelope of these wavelets, accounting for both amplitude and phase.

Kirchhoff diffraction integral. The field at point PP due to an aperture in a screen is:

E(P)=iλapertureE(Q)eikrrcosθdSE(P) = \frac{i}{\lambda}\iint_{\mathrm{aperture} E(Q)\,\frac{e^{-ikr}}{r}\cos\theta\,dS}

Where E(Q)E(Q) is the field at the aperture point QQ, rr is the distance from QQ to PPAnd θ\theta Is the angle between the normal to the aperture and the direction to PP. The obliquity factor cosθ\cos\theta ensures that wavelets do not propagate backwards. In the Fraunhofer limit (rr \to \infty), This integral reduces to the Fourier transform of the aperture function (see Sections 4.8 and 7.1).

4.2 Single-Slit Diffraction

A slit of width aa is illuminated by plane waves of wavelength λ\lambda.

Intensity distribution (Fraunhofer diffraction):

I(θ)=I0(sinαα)2I(\theta) = I_0 \left(\frac{\sin\alpha}{\alpha}\right)^2

Where α=πasinθλ\alpha = \frac{\pi a \sin\theta}{\lambda}.

Derivation. Divide the slit into infinitesimal elements of width dydy at position yy. Each Element contributes a wavelet. The field at angle θ\theta on a distant screen:

E(θ)=a/2a/2E0eikysinθdy=E0sin(kasinθ2)ksinθ2=E0asinααE(\theta) = \int_{-a/2}^{a/2} E_0\, e^{iky\sin\theta}\,dy = E_0 \frac{\sin\left(\frac{ka\sin\theta}{2}\right)}{\frac{k\sin\theta}{2}} = E_0 a \frac{\sin\alpha}{\alpha}

Where α=kasinθ/2=πasinθ/λ\alpha = ka\sin\theta/2 = \pi a\sin\theta/\lambda. Since IE2I \propto |E|^2:

I(θ)=I0(sinαα)2I(\theta) = I_0 \left(\frac{\sin\alpha}{\alpha}\right)^2

\blacksquare

Minima: α=mπ\alpha = m\piI.e., asinθ=mλa\sin\theta = m\lambda for m=±1,±2,m = \pm 1, \pm 2, \ldots

Central maximum: at θ=0\theta = 0With width (first zero to first zero) Δθ=2λ/a\Delta\theta = 2\lambda/a.

The secondary maxima occur approximately midway between consecutive minima. Their intensities are: I1/I00.045I_1/I_0 \approx 0.045 (first secondary), I2/I00.016I_2/I_0 \approx 0.016 (second), decreasing rapidly.

Worked Example: Single-slit diffraction intensity

Problem. Light of wavelength λ=580\lambda = 580 nm passes through a slit of width a=0.10a = 0.10 mm. Find (a) the angular width of the central maximum, and (b) the intensity at θ=0.50°\theta = 0.50° Relative to the central maximum.

Solution.

(a) First minimum at sinθ1=λ/a=580×109/(0.10×103)=5.80×103\sin\theta_1 = \lambda/a = 580 \times 10^{-9}/(0.10 \times 10^{-3}) = 5.80 \times 10^{-3} So θ1=0.332°\theta_1 = 0.332°. Angular width of central maximum: 2θ1=0.664°2\theta_1 = 0.664°.

(b) α=πasinθ/λ=π(0.10×103)sin(0.50°)/(580×109)\alpha = \pi a\sin\theta/\lambda = \pi(0.10 \times 10^{-3})\sin(0.50°)/(580 \times 10^{-9}) =π(0.10×103)(8.73×103)/(580×109)=π(1.505)=4.73= \pi(0.10 \times 10^{-3})(8.73 \times 10^{-3})/(580 \times 10^{-9}) = \pi(1.505) = 4.73.

I/I0=(sinα/α)2=(sin4.73/4.73)2=(0.9998/4.73)2=(0.2114)2=0.0447I/I_0 = (\sin\alpha/\alpha)^2 = (\sin 4.73/4.73)^2 = (-0.9998/4.73)^2 = (0.2114)^2 = 0.0447.

The intensity is about 4.5% of the central maximum.

:::caution Common Pitfall The condition for the first minimum in single-slit diffraction is asinθ=λa\sin\theta = \lambda (not λ/2\lambda/2). The factor of 2 difference from the double-slit maximum condition (dsinθ=λd\sin\theta = \lambda) Reflects the fundamentally different geometry: in single-slit diffraction, the minimum occurs when Wavelets from the edges cancel, requiring a path difference of one full wavelength between them.

4.3 Double-Slit with Finite Width

Combining single-slit diffraction and double-slit interference:

I(θ)=I0(sinαα)2cos2βI(\theta) = I_0 \left(\frac{\sin\alpha}{\alpha}\right)^2 \cos^2\beta

Where α=πasinθ/λ\alpha = \pi a\sin\theta/\lambda (diffraction envelope) and β=πdsinθ/λ\beta = \pi d\sin\theta/\lambda (interference fringes).

The interference fringes are modulated by the diffraction envelope. Missing orders occur when β=mπ\beta = m\pi coincides with α=nπ\alpha = n\piI.e., when d/ad/a is a ratio of integers.

Worked Example: Missing orders in a double-slit pattern

Problem. A double slit has slit width a=0.040a = 0.040 mm and slit separation d=0.20d = 0.20 mm, illuminated By light of wavelength λ=550\lambda = 550 nm. (a) Which interference orders are missing? (b) How many Bright fringes appear within the central diffraction envelope?

Solution.

(a) Missing orders occur when d/ad/a is an integer: d/a=0.20/0.04=5d/a = 0.20/0.04 = 5. The interference orders m=±5,±10,m = \pm 5, \pm 10, \ldots coincide with diffraction minima and are missing.

(b) The central diffraction envelope extends from θ=λ/a\theta = -\lambda/a to θ=+λ/a\theta = +\lambda/a. The highest visible order satisfies dsinθ<d(λ/a)=(d/a)λ=5λd\sin\theta \lt d(\lambda/a) = (d/a)\lambda = 5\lambda I.e., m<5m \lt 5. So orders m=0,±1,±2,±3,±4m = 0, \pm 1, \pm 2, \pm 3, \pm 4 are visible: 9 bright fringes Within the central envelope.

4.4 Diffraction Gratings

A grating with NN slits, each of width aaSeparated by distance dd:

I(θ)=I0(sinαα)2(sinNβsinβ)2I(\theta) = I_0 \left(\frac{\sin\alpha}{\alpha}\right)^2 \left(\frac{\sin N\beta}{\sin\beta}\right)^2

Principal maxima: dsinθ=mλd\sin\theta = m\lambda (m=0,±1,±2,m = 0, \pm 1, \pm 2, \ldots).

The angular width of a principal maximum is Δθ=λ/(Ndcosθ)\Delta\theta = \lambda/(Nd\cos\theta). The resolving power of a grating is:

R=λΔλ=mNR = \frac{\lambda}{\Delta\lambda} = mN

Where NN is the total number of illuminated slits.

Worked Example: Grating resolving power

Problem. A diffraction grating has 5000 lines/cm and is 5.0 cm wide. Find the resolving power In the first order and the minimum resolvable wavelength difference at λ=600\lambda = 600 nm.

Solution. Total number of slits: N=5000×5.0=25000N = 5000 \times 5.0 = 25000. Slit spacing: d=1/5000d = 1/5000 cm =2.00×106= 2.00 \times 10^{-6} m =2.00= 2.00 μ\muM.

Resolving power: R=mN=1×25000=25000R = mN = 1 \times 25000 = 25000.

Minimum resolvable wavelength difference: δλ=λ/R=600/25000=0.024\delta\lambda = \lambda/R = 600/25000 = 0.024 nm.

4.5 The Rayleigh Criterion

Two point sources are just resolvable when the central maximum of one coincides with the first minimum Of the other:

θmin=1.22λD\theta_{\mathrm{min} = 1.22\frac{\lambda}{D}}

Where DD is the aperture diameter (for a circular aperture).

4.6 Fresnel vs. Fraunhofer Diffraction

Fraunhofer (far-field): Source and screen are at infinity (or at the focal plane of a lens). Requires a2/λLa^2/\lambda \ll L (Fresnel number NF1N_F \ll 1).

Fresnel (near-field): Source and/or screen are at finite distances. The Fresnel number NF=a2/(λL)N_F = a^2/(\lambda L) characterises the regime. Fresnel diffraction uses Fresnel integrals and Produces patterns that depend on the distance.

4.7 Circular Aperture and the Airy Disk

For a circular aperture of diameter DDThe Fraunhofer diffraction pattern is an Airy pattern:

I(θ)=I0[2J1(β)β]2I(\theta) = I_0 \left[\frac{2J_1(\beta)}{\beta}\right]^2

Where β=πDsinθ/λ\beta = \pi D \sin\theta / \lambda and J1J_1 is the first-order Bessel function of the first Kind.

Derivation. The field in the Fraunhofer limit is the Fourier transform of the circular aperture Function t(r)=1t(r) = 1 for rD/2r \leq D/2 and 00 otherwise. In polar coordinates:

E(θ)0D/2J0(krsinθ)rdr=D2J1(β)βE(\theta) \propto \int_0^{D/2} J_0(kr\sin\theta)\, r\,dr = \frac{D}{2}\frac{J_1(\beta)}{\beta}

Where we used the identity 0aJ0(ρr)rdr=aJ1(ρa)/ρ\int_0^a J_0(\rho r)\,r\,dr = aJ_1(\rho a)/\rho. Since IE2I \propto |E|^2 The result follows. \blacksquare

The first zero of J1(β)J_1(\beta) is at β=1.22π\beta = 1.22\piGiving:

sinθ1=1.22λD\sin\theta_1 = 1.22\frac{\lambda}{D}

The bright central disk (the Airy disk) subtends an angle:

θAiry=1.22λD\theta_{\mathrm{Airy} = 1.22\frac{\lambda}{D}}

This is the basis of the Rayleigh criterion for resolving power of circular apertures (telescopes, Microscopes, the eye). Approximately 84% of the total transmitted power falls within the Airy disk.

Worked Example: Telescope resolving power

Problem. A telescope has a primary mirror of diameter D=150D = 150 mm. Find its angular resolution At λ=550\lambda = 550 nm. Two stars are separated by 0.50"0.50"' (arcseconds). Can this telescope resolve Them?

Solution. Angular resolution: θmin=1.22λ/D=1.22(550×109)/(0.150)=4.47×106\theta_{\min} = 1.22\lambda/D = 1.22(550 \times 10^{-9})/(0.150) = 4.47 \times 10^{-6} rad.

Convert to arcseconds: 4.47×106×(180/π)×3600=0.9234.47 \times 10^{-6} \times (180/\pi) \times 3600 = 0.923''.

Since 0.50<0.9230.50'' \lt 0.923''The telescope cannot resolve these two stars — they would appear as a Single blurred source.

4.8 Introduction to Fourier Optics

The Fraunhofer diffraction integral has a deep connection with Fourier analysis. For an aperture With transmission function t(x,y)t(x, y)The far-field diffraction pattern is:

E(θx,θy)t(x,y)ei(kxx+kyy)dxdyE(\theta_x, \theta_y) \propto \iint t(x,y)\, e^{-i(k_x x + k_y y)}\,dx\,dy

Where kx=ksinθxk_x = k\sin\theta_x and ky=ksinθyk_y = k\sin\theta_y. This is precisely the two-dimensional Fourier transform of t(x,y)t(x,y)Evaluated at spatial frequencies kx/(2π)k_x/(2\pi) and ky/(2π)k_y/(2\pi).

Key consequences:

  1. A lens of focal length ffPlaced one focal length after the aperture, produces the Fourier transform at its back focal plane — it performs an optical Fourier transform.
  2. Narrow features in the aperture (small aa) produce broad diffraction patterns (large spread in kk-space), and vice versa — the optical analogue of the uncertainty principle.
  3. Spatial filtering: by placing masks in the Fourier plane, one can selectively remove or enhance spatial frequency components, modifying the image (the basis of optical image processing).

Example. A single slit of width aa has aperture function t(x)=rect(x/a)t(x) = \mathrm{rect}(x/a). Its Fourier Transform is sinc(πasinθ/λ)\mathrm{sinc}(\pi a \sin\theta/\lambda)Directly giving the single-slit diffraction Pattern. A periodic grating has sharp peaks in the Fourier transform (the diffraction orders), each Corresponding to a spatial harmonic of the grating.

Spatial filtering. A powerful application of Fourier optics is the manipulation of images by Modifying their spatial frequency content:

  • Low-pass filter: A small aperture in the Fourier plane passes only the zeroth and low-order diffraction, removing fine detail (smoothing).
  • High-pass filter: An opaque spot blocking the zeroth order removes the DC component, enhancing edges and fine structure (phase contrast microscopy).
  • Band-pass filter: Selective removal of specific spatial frequencies (e.g., removing periodic noise from an image).

Phase contrast microscopy (Zernike, 1953) is a celebrated application. Biological specimens are Mostly transparent (phase objects) and produce no intensity contrast in ordinary microscopy. By Introducing a π/2\pi/2 phase shift to the undiffracted (zeroth-order) light in the Fourier plane, Phase variations are converted to intensity variations, making transparent structures visible.

Worked Example: Fourier analysis of a double slit

Problem. A double slit has width aa and centre-to-centre separation d=3ad = 3a. Use Fourier optics To predict the diffraction pattern and identify the missing orders.

Solution. The aperture function is t(x)=rect(x/a)[δ(x3a/2)+δ(x+3a/2)]t(x) = \mathrm{rect}(x/a) * [\delta(x - 3a/2) + \delta(x + 3a/2)] I.e., the convolution of a single-slit function with two delta functions.

By the convolution theorem, the Fourier transform is the product of a sinc function (single slit) and cos(πdsinθ/λ)\cos(\pi d \sin\theta/\lambda) (two-point interference):

E(θ)sinc(πasinθ/λ)cos(π3asinθ/λ)E(\theta) \propto \mathrm{sinc}(\pi a\sin\theta/\lambda) \cdot \cos(\pi \cdot 3a \sin\theta/\lambda)

The sinc envelope has zeros at asinθ=mλa\sin\theta = m\lambda. The cosine fringes have maxima at 3asinθ=mλ3a\sin\theta = m\lambda. Missing orders when 3asinθ=3λ3a\sin\theta = 3\lambda coincides with asinθ=λa\sin\theta = \lambda: the third order (m=3m = 3) and all multiples of 3 are missing. This confirms d/a=3d/a = 3 as the ratio for missing orders.

:::